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At European Recruitment, our sectors cover a wide range of industries within the field of technology
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range of industries within the field of technology
At European Recruitment, our sectors cover a wide
range of industries within the field of technology
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mmWave ATE Test Engineer
We focus on edge sensors spanning multiple modalities including LiDAR, radar, ultrasound and vision for Advanced Driver Assistance Systems (ADAS), autonomous vehicles, connected car, user experience and electrification applications.
Key Qualifications
- Master or comparable Degree in Electrical Engineering / microwave Engineering
- Analytical, Strong Planning and Organizing Skills
- Knowledge with hands on experience in mm-wave amplifiers, mixers IC, beamformer IC, low noise amplifiers & Power amplifiers testing.
- Good knowledge in measuring and understanding of RF measurement parameters like S-parameter, Stability, Noise Figure (NF), Linearity (P1dB), Intermodulation (IM3),
- Conversion gain, Single/Multi Channel signal Analysis (Standard Modulation schemes, Digital Video, etc.)
- Hands on experience is required for performing above RF measurement parameters using Laboratory Test Equipment such as Network Analyzers & its applications, Signal Analyzers,
- Phase Noise Analyzers, and industry standard test equipment for signal analysis
- Creating compliance matrices against spec, plotting results, and presenting results
- Identifying test components for RF testing according to test methodology
- Exposures to post-Silicon validation, silicon bring-up, testing/debug/root cause of circuit marginalities, product engineering, foundry manufacturing, etc.
- Experience working with cross-functional teams
- System level & RF/SOC experience is a plus
- Strong programming skills for writing and debugging test programs and HW related issues.
- Competency in programming with Scripting languages (i.e.., Perl/Python) and high-level languages (i.e.., C/C++ or JAVA)
- Preferred knowledge on V93000 SOC Tester – Smartest 7 or Smartest 8
- You are comfortable working primarily in a lab environment
- You have good experimental technique, techniques of problem localization and root-cause
- Good data analysis skills and attention to details
- Knowledge in load board design, testing, and debugging
- Nice-to-haves (in at least one and preferably several areas):
- Chip design background in circuit/physical design (timing closure, power, etc.) or DV (correlating SW signatures to block level tests).
- Post silicon physical debug background in speed-path/Vmin, memory arrays, clocking, or yield improvements.
- Post silicon logic debug background in exercising various DFX features, analyzing scan-dump/mem-dump, suggesting tests in both system level and in DV
- Product engineering background and familiarity with ATE coverage, margin, binning, scan pattern generation, etc.
- MIPI protocols
Requirements
- Responsibility for test program development on Advantest 93K SmartScale/ExaScale RF for mmWave Automotive Radar ICs
- Development of Test Hardware and test program for mmWave tests
- Support the implementation of DfX into new products in close cooperation with Test Architects, Product Development and Product Engineering
- Able to summarize debugs/findings and think along the line of improvements in both DFX features and test coverage.
- Based on the overall test strategy, develop test-concepts, test-programs, and test-hardware for wafer- and final-test, according to the Automotive requirements specification
- Be responsible for reaching of test engineering related milestones
- Be involved in digital & analog test pattern creation and simulation process and generation of tester dependent test-vectors
- Define and develop test methods and techniques
- Be involved in development of production and characterization hardware for automatic test equipment with high test coverage (wafer and final test)
- Analyze the test data and report results into the IC design teams
- Be responsible for introduction and release of the mass-production related software and hardware
- Understanding new chip features and define coverage applicable to our test environment
- Be the first line of defense when failure occurs to isolate (setup, code, artifacts, silicon issues, logic/physical, identify blocks, etc.).
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